Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...

SAN JOSE — The IC-testing and engineering services unit of Schlumberger Ltd., called Saber, has announced a strategic alliance with SynTest Technologies Inc. to bridge the gap between design-for-test ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

This is accomplished by connecting all of the design's registers in serial fashion, allowing test engineers to shift data in and out through a few ports at the chip level (Fig. 1). That allows, for ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

The software testing landscape is undergoing a seismic shift. For years, continuous automation testing (CAT) platforms have been the gold standard for reducing manual testing and ensuring ...

While auto safety experts find the new dummy designs promising, there are limitations to physical tools when testing vehicle crash outcomes. The 5th percentile federal standard for female dummies is 4 ...

The EDA leader has generated over $500M to date in AI tools and technologies. Now a new data analytics solution applies data management, curation, and analysis across the entire pipeline of chip ...